Scanning Electron Microscope

Purpose Scanning electron microscope (SEM) is a type a electron microscope capable of producing high resolution images with a characteristic three-dimensional appearance of a sample surface. Specially, this SEM is a useful tool for judging the surface structure of the sample and, using LV mode, is possible to produce low resolution images measuring a non-conductive specimen without additional pre-treatment.
Specifications 1. Specimens: silicon, metal, plastic, or biological samples
2. Resolution: 3.0nm
3. Magnification: from Ąż5 to Ąż30,000
Option 1. Low vacuum (LV) mode
2. Airlock chamber
3. XY automation stage
Model / Company JSM-6390LV / JEOL